Memory Efficient ATPG for Path Delay Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/LongYLM97
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/LongYLM97
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shiyuan_Yang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wangning_Long
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yinghua_Min
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zhongcheng_Li
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643978
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.1997.643978
>
dc:
identifier
DBLP conf/ats/LongYLM97
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.1997.643978
(xsd:string)
dcterms:
issued
1997
(xsd:gYear)
rdfs:
label
Memory Efficient ATPG for Path Delay Faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shiyuan_Yang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wangning_Long
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yinghua_Min
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zhongcheng_Li
>
swrc:
pages
326-331
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/LongYLM97/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/LongYLM97
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats1997.html#LongYLM97
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.1997.643978
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
subject
Automatic Test Generation, Delay Testing, IC Testing, Path Sensitization
(xsd:string)
dc:
title
Memory Efficient ATPG for Path Delay Faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document