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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/LuSLC00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Wen_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893646>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893646>
dc:identifier DBLP conf/ats/LuSLC00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893646 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Is IDDQ testing not applicable for deep submicron VLSI in year 2011? (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Wen_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
swrc:pages 338-343 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/LuSLC00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/LuSLC00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#LuSLC00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893646>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject leakage currents; integrated circuit testing; VLSI; CMOS integrated circuits; statistical analysis; IDDQ testing; deep submicron VLSI; IDDQ current estimation; statistical approach; standard deviation; circuit size; random process deviations; input vectors; IDDQ distributions (xsd:string)
dc:title Is IDDQ testing not applicable for deep submicron VLSI in year 2011? (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document