[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MacDonaldT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_W._MacDonald>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893664>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893664>
dc:identifier DBLP conf/ats/MacDonaldT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893664 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Testing domino circuits in SOI technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_W._MacDonald>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 441-446 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MacDonaldT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/MacDonaldT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#MacDonaldT00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893664>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject CMOS logic circuits; silicon-on-insulator; fault simulation; leakage currents; logic testing; automatic testing; integrated circuit testing; domino circuits; SOI technology; dynamic circuit styles; fault modeling analysis; overall fault coverage; parasitic bipolar leakage; CMOS logic (xsd:string)
dc:title Testing domino circuits in SOI technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document