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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MaedaMP17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Matsushima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ron_Press>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoichi_Maeda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2017.52>
foaf:homepage <https://doi.org/10.1109/ATS.2017.52>
dc:identifier DBLP conf/ats/MaedaMP17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2017.52 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Matsushima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ron_Press>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoichi_Maeda>
swrc:pages 237-241 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MaedaMP17/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2017.html#MaedaMP17>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2017.52>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document