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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MasuzawaIWF00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Wada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minoru_Izutsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshimitsu_Masuzawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893627>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893627>
dc:identifier DBLP conf/ats/MasuzawaIWF00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893627 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Single-control testability of RTL data paths for BIST. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Wada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minoru_Izutsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshimitsu_Masuzawa>
swrc:pages 210-215 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MasuzawaIWF00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/MasuzawaIWF00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#MasuzawaIWF00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893627>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject built-in self test; logic testing; integrated circuit testing; automatic test pattern generation; design for testability; VLSI; digital integrated circuits; single-control testability; RTL data paths; BIST method; hierarchical test; test pattern generators; response analyzers; DFT method; high fault coverage; single stuck-at faults; low hardware overhead; at-speed testing; transition faults; delay faults; ATPG; VLSI circuits (xsd:string)
dc:title Single-control testability of RTL data paths for BIST. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document