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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MichinishiYOKH02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Michinishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuji_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tokumi_Yokohira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshifumi_Kobayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Hondo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2002.1181747>
foaf:homepage <https://doi.org/10.1109/ATS.2002.1181747>
dc:identifier DBLP conf/ats/MichinishiYOKH02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2002.1181747 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Michinishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuji_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tokumi_Yokohira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshifumi_Kobayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Hondo>
swrc:pages 417-422 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MichinishiYOKH02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/MichinishiYOKH02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2002.html#MichinishiYOKH02>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2002.1181747>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document