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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MiuraNF99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiromu_Fujioka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuyoshi_Miura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nakamae>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1999.810772>
foaf:homepage <https://doi.org/10.1109/ATS.1999.810772>
dc:identifier DBLP conf/ats/MiuraNF99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1999.810772 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Intelligent EB Test System for Automatic VLSI Fault Tracing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiromu_Fujioka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuyoshi_Miura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nakamae>
swrc:pages 335-341 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MiuraNF99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/MiuraNF99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1999.html#MiuraNF99>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1999.810772>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject VLSI, fault tracing, electron beam test system, fault tracing, intelligent system (xsd:string)
dc:title Intelligent EB Test System for Automatic VLSI Fault Tracing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document