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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/MiyazakiHDMF03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Date>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahide_Miyazaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiaki_Muraoka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshinori_Hosokawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2003.1250847>
foaf:homepage <https://doi.org/10.1109/ATS.2003.1250847>
dc:identifier DBLP conf/ats/MiyazakiHDMF03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2003.1250847 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label A DFT Selection Method for Reducing Test Application Time of System-on-Chips. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Date>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahide_Miyazaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiaki_Muraoka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshinori_Hosokawa>
swrc:pages 412-417 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/MiyazakiHDMF03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/MiyazakiHDMF03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2003.html#MiyazakiHDMF03>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2003.1250847>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject test scheduling, test access mechanism, wrapper, design for test (xsd:string)
dc:title A DFT Selection Method for Reducing Test Application Time of System-on-Chips. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document