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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/NakamuraSNUCKUT05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akio_Shirokane>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anis_Uzzaman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brion_L._Keller>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Nakamura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Ube>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_Chickermane>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshihiko_Terauchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshihito_Nishizaki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2005.75>
foaf:homepage <https://doi.org/10.1109/ATS.2005.75>
dc:identifier DBLP conf/ats/NakamuraSNUCKUT05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2005.75 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akio_Shirokane>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anis_Uzzaman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brion_L._Keller>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Nakamura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Ube>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_Chickermane>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshihiko_Terauchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshihito_Nishizaki>
swrc:pages 156-161 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ATS.2005.75>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document