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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/NiiTIYFO12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Ishii>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2012.59>
foaf:homepage <https://doi.org/10.1109/ATS.2012.59>
dc:identifier DBLP conf/ats/NiiTIYFO12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2012.59 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuichiro_Ishii>
swrc:pages 246-251 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2012>
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rdfs:seeAlso <https://doi.org/10.1109/ATS.2012.59>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title A Test Screening Method for 28 nm HK/MG Single-Port and Dual-Port SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document