An extended march test algorithm for embedded memories.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/ParkC97
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1997
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An extended march test algorithm for embedded memories.
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integrated memory circuits; embedded memories; efficient test algorithm; BIST architecture; stuck-at fault; transition fault; coupling fault; neighborhood pattern sensitive fault; background data; word-oriented memory testing; extended march test algorithm
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An extended march test algorithm for embedded memories.
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