Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
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Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
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hazards and race conditions; integrated memory circuits; integrated circuit testing; timing analysis; imaging circuit analysis; IBM G6 microprocessor; L1 cache; non-invasive backside timing; Picosecond Imaging Circuit Analysis; race condition; circuit switching; waveform extraction
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Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
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