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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/PomeranzR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485340>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485340>
dc:identifier DBLP conf/ats/PomeranzR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485340 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Static compaction for two-pattern test sets. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 222-228 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/PomeranzR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/PomeranzR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#PomeranzR95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485340>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject combinational circuits; logic testing; fault diagnosis; automatic testing; built-in self test; integrated circuit testing; delays; CMOS logic circuits; two-pattern test sets; static compaction procedure; test set size reduction; redundant tests removal; redundant patterns removal; fault coverage; delay faults; CMOS stuck open faults; ATPG; reordering of tests; digital logic circuits; combinational circuits (xsd:string)
dc:title Static compaction for two-pattern test sets. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document