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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/RafiqITR98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sassan_Tabatabaei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sumbal_Rafiq>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741618>
foaf:homepage <https://doi.org/10.1109/ATS.1998.741618>
dc:identifier DBLP conf/ats/RafiqITR98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1998.741618 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Testing for Floating Gates Defects in CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sassan_Tabatabaei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sumbal_Rafiq>
swrc:pages 228-236 (xsd:string)
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owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/RafiqITR98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/RafiqITR98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1998.html#RafiqITR98>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1998.741618>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Testing for Floating Gates Defects in CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document