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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean_Marc_Galli%E2%88%9A%C2%AEre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2003.1250804>
foaf:homepage <https://doi.org/10.1109/ATS.2003.1250804>
dc:identifier DBLP conf/ats/RenovellGAB03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2003.1250804 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Delay Testing of MOS Transistor with Gate Oxide Short. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean_Marc_Galli%E2%88%9A%C2%AEre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
swrc:pages 168-173 (xsd:string)
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owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/RenovellGAB03/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2003.html#RenovellGAB03>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2003.1250804>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Delay Testing of MOS Transistor with Gate Oxide Short. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document