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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/RenovellPFFZ00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Penelope_Faure>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893644>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893644>
dc:identifier DBLP conf/ats/RenovellPFFZ00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893644 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label TOF: a tool for test pattern generation optimization of an FPGA application oriented test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Penelope_Faure>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
swrc:pages 323-328 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/RenovellPFFZ00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/RenovellPFFZ00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#RenovellPFFZ00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893644>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject field programmable gate arrays; logic testing; integrated circuit testing; optimisation; automatic test pattern generation; TOF tool; test pattern generation optimization; FPGA application oriented test; application-oriented test procedure; RAM-based FPGAs; AC nonredundant fault coverage; circuit netlist; TPG optimisation tool; ATPG (xsd:string)
dc:title TOF: a tool for test pattern generation optimization of an FPGA application oriented test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document