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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/RzeszutKS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rzeszut>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485327>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485327>
dc:identifier DBLP conf/ats/RzeszutKS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485327 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label A new method for testing mixed analog and digital circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rzeszut>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
swrc:pages 127-132 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/RzeszutKS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/RzeszutKS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#RzeszutKS95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485327>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject mixed analogue-digital integrated circuits; integrated circuit testing; shift registers; analogue processing circuits; charge-coupled device circuits; mixed analog and digital circuits; analog test points; simultaneous observation; analog multiplexer; signal path; charge coupled device; analog shift register; input voltage (xsd:string)
dc:title A new method for testing mixed analog and digital circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document