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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/SatoNKIO0OIZKKH22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Iimori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gaku_Ogihara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazumi_Hatayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keno_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kentaroh_Katoh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shogo_Katayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ishida_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Nakatani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ichikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yujie_Zhao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS56056.2022.00019>
foaf:homepage <https://doi.org/10.1109/ATS56056.2022.00019>
dc:identifier DBLP conf/ats/SatoNKIO0OIZKKH22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS56056.2022.00019 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Iimori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gaku_Ogihara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazumi_Hatayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keno_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kentaroh_Katoh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shogo_Katayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ishida_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Nakatani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ichikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yujie_Zhao>
swrc:pages 37-42 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/SatoNKIO0OIZKKH22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/SatoNKIO0OIZKKH22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2022.html#SatoNKIO0OIZKKH22>
rdfs:seeAlso <https://doi.org/10.1109/ATS56056.2022.00019>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document