Generator choices for delay test.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/Savir95
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1995
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Generator choices for delay test.
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214-221
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dc:
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built-in self test; boundary scan testing; fault diagnosis; logic testing; delays; shift registers; automatic testing; VLSI; integrated circuit testing; BIST based delay test; generator choices; test vectors; timing requirement; delay test vector generator; scan designs; nonscan designs; performance; cost; flexibility; linear feedback shift register; transition test; skewed-load delay test; pseudo-random test; shift dependency; digital logic circuits; ATPG
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Generator choices for delay test.
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