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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/Savir95a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485347>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485347>
dc:identifier DBLP conf/ats/Savir95a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485347 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Module level weighted random patterns. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
swrc:pages 274-278 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/Savir95a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/Savir95a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#Savir95a>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485347>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject automatic testing; logic testing; integrated circuit testing; boundary scan testing; multivalued logic circuits; probability; module level self-test architecture; weighted random patterns; pseudorandom pattern generator; universal weighting generator; scan test; multiple input signature register; scan latch; near-optimal weight; signal pins; weight control function; self-test time (xsd:string)
dc:title Module level weighted random patterns. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document