High-speed generation of LFSR signatures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/ShiehLS00
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High-speed generation of LFSR signatures.
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binary sequences; automatic test pattern generation; built-in self test; performance evaluation; logic testing; integrated circuit testing; high-speed generation; LFSR signatures; compaction simulation; single-input signature register; equivalent multiple-input implementation; subsequences; finite field theory; high-speed signature computations; lookahead technique; internal-XOR LFSR; external-XOR LFSR; linear feedback shift register; BIST
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High-speed generation of LFSR signatures.
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