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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/ShinogiUH00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ushio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Terumine_Hayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsuyoshi_Shinogi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893650>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893650>
dc:identifier DBLP conf/ats/ShinogiUH00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893650 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Cyclic greedy generation method for limited number of IDDQ tests. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ushio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Terumine_Hayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsuyoshi_Shinogi>
swrc:pages 362- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/ShinogiUH00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/ShinogiUH00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#ShinogiUH00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893650>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject integrated circuit testing; CMOS integrated circuits; electric current measurement; fault diagnosis; iterative methods; cyclic greedy generation method; IDDQ tests; test patterns; cyclic; iterative method; random patterns; undetected faults; ISCAS85Y circuits; short circuit faults; CMOS IC (xsd:string)
dc:title Cyclic greedy generation method for limited number of IDDQ tests. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document