[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/SrinivasAB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mandyam-Komar_Srinivas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485358>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485358>
dc:identifier DBLP conf/ats/SrinivasAB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485358 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Functional test generation for path delay faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mandyam-Komar_Srinivas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 339-345 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/SrinivasAB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/SrinivasAB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#SrinivasAB95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485358>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject programmable logic arrays; delays; multivalued logic; fault location; fault diagnosis; logic testing; functional test generation; path delay faults; programmable logic arrays; PLA; growth faults; disappearance faults; robustly detectable path delay faults; two-level circuit; algebraic transformations; generated vectors; stuck faults; algebraically factored multilevel circuit; timings; fault coverages; scan/hold versions; ISCAS89 circuits (xsd:string)
dc:title Functional test generation for path delay faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document