Syndrome Simulation And Syndrome Test For Unscanned Interconnects.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/SuHJT96
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1996
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Syndrome Simulation And Syndrome Test For Unscanned Interconnects.
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boundary scan testing; unscanned interconnects; syndrome test methodology; event driven syndrome simulation; boundary scan environment; test length; faulty syndromes; fault-free syndromes; simulation algorithm; test cost reduction; set covering problem; tolerable error rate; partially scanned PCB; MCM; test pattern generation; weighted random patterns; board level testing
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Syndrome Simulation And Syndrome Test For Unscanned Interconnects.
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