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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/TakahashiBT98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741599>
foaf:homepage <https://doi.org/10.1109/ATS.1998.741599>
dc:identifier DBLP conf/ats/TakahashiBT98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1998.741599 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 108-112 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/TakahashiBT98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/TakahashiBT98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1998.html#TakahashiBT98>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1998.741599>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document