Generation of tenacious tests for small gate delay faults in combinational circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/TakahashiWT95
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1995
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Generation of tenacious tests for small gate delay faults in combinational circuits.
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combinational circuits; fault diagnosis; logic testing; delays; tenacious tests; small gate delay faults; combinational circuits; test generation; single gate delay fault; ISCAS'85 benchmark circuits; fault coverage
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Generation of tenacious tests for small gate delay faults in combinational circuits.
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