Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/TakahashiYHT04
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/TakahashiYHT04
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yukihiro_Yamamoto
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.2004.41
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.2004.41
>
dc:
identifier
DBLP conf/ats/TakahashiYHT04
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.2004.41
(xsd:string)
dcterms:
issued
2004
(xsd:gYear)
rdfs:
label
Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yukihiro_Yamamoto
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu
>
swrc:
pages
216-221
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/2004
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/TakahashiYHT04/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/TakahashiYHT04
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats2004.html#TakahashiYHT04
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.2004.41
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
title
Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document