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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/TakahashiYT95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nobuhiro_Yanagida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485317>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485317>
dc:identifier DBLP conf/ats/TakahashiYT95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485317 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nobuhiro_Yanagida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 58-64 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/TakahashiYT95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/TakahashiYT95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#TakahashiYT95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485317>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject combinational circuits; fault diagnosis; logic testing; fault location; electron beam testing; VLSI; multiple fault diagnosis; combinational circuits; sensitized paths; EB testing; TP-1; TP-2; TP-3; TP-4; electron-beam tester; fault location; stuck-at faults; internal lines; diagnostic resolution (xsd:string)
dc:title Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document