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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/WangT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsin-Po_Wang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jon_Turino>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893591>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893591>
dc:identifier DBLP conf/ats/WangT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893591 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label DFT and BIST techniques for the future. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsin-Po_Wang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jon_Turino>
swrc:pages 6-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/WangT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/WangT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#WangT00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893591>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject built-in self test; logic testing; design for testability; production testing; integrated circuit economics; DFT; BIST; multimillion gate system-on-chip; multinational design; time to market; integrated circuit design; quality; economics; IC design (xsd:string)
dc:title DFT and BIST techniques for the future. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document