Transistor leakage fault location with ZDDQ measurement.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/WenTK95
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1995
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Transistor leakage fault location with ZDDQ measurement.
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fault location; fault diagnosis; logic testing; logic arrays; electric current measurement; leakage currents; CMOS logic circuits; field effect transistor circuits; transistor leakage fault location; I/sub DDQ/ measurement; equivalence fault collapsing; deterministic tests; random tests; diagnostic resolution; diagnosed faults; gate-array circuit; CMOS circuit
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Transistor leakage fault location with ZDDQ measurement.
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