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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/WeyL04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chin-Long_Wey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng-Yao_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2004.28>
foaf:homepage <https://doi.org/10.1109/ATS.2004.28>
dc:identifier DBLP conf/ats/WeyL04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2004.28 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Burn-In Stress Test of Analog CMOS ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chin-Long_Wey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng-Yao_Liu>
swrc:pages 360-365 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/WeyL04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/WeyL04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2004.html#WeyL04>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2004.28>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Burn-In Stress Test of Analog CMOS ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document