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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/WorsmanWL00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthew_Worsman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mike_W._T._Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yim-Shu_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2000.893607>
foaf:homepage <https://doi.org/10.1109/ATS.2000.893607>
dc:identifier DBLP conf/ats/WorsmanWL00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2000.893607 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Analog circuit equivalent faults in the D.C. domain. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthew_Worsman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mike_W._T._Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yim-Shu_Lee>
swrc:pages 84-89 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/WorsmanWL00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/WorsmanWL00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2000.html#WorsmanWL00>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2000.893607>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject analogue circuits; fault location; fault simulation; design for testability; built-in self test; analog circuit faults; fault location; fault simulation data; equivalent faults; linear analog circuits; equivalent fault identification; data analysis (xsd:string)
dc:title Analog circuit equivalent faults in the D.C. domain. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document