Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/XiangCSF03
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/XiangCSF03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jia-Guang_Sun
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ming-Jing_Chen
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.2003.1250774
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.2003.1250774
>
dc:
identifier
DBLP conf/ats/XiangCSF03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.2003.1250774
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jia-Guang_Sun
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ming-Jing_Chen
>
swrc:
pages
12-17
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/XiangCSF03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/XiangCSF03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats2003.html#XiangCSF03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.2003.1250774
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
title
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document