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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/XiangGF03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shan_Gu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2003.1250827>
foaf:homepage <https://doi.org/10.1109/ATS.2003.1250827>
dc:identifier DBLP conf/ats/XiangGF03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2003.1250827 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shan_Gu>
swrc:pages 300-305 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/XiangGF03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/XiangGF03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2003.html#XiangGF03>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2003.1250827>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document