Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ats/XuLCL03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yongjun_Xu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zhiguo_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zuying_Luo
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FATS.2003.1250809
>
foaf:
homepage
<
https://doi.org/10.1109/ATS.2003.1250809
>
dc:
identifier
DBLP conf/ats/XuLCL03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FATS.2003.1250809
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yongjun_Xu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zhiguo_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zuying_Luo
>
swrc:
pages
196-201
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ats/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ats/XuLCL03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ats/XuLCL03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ats/ats2003.html#XuLCL03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ATS.2003.1250809
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ats
>
dc:
subject
macromodeling, stack effect, leakage current simulation, propagation of signal probability
(xsd:string)
dc:
title
Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document