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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/YamadaYM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Yamazaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Teruhiko_Yamada>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1995.485318>
foaf:homepage <https://doi.org/10.1109/ATS.1995.485318>
dc:identifier DBLP conf/ats/YamadaYM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1995.485318 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label A simple technique for locating gate-level faults in combinational circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Yamazaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Teruhiko_Yamada>
swrc:pages 65-70 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/YamadaYM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/YamadaYM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1995.html#YamadaYM95>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1995.485318>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject combinational circuits; fault diagnosis; logic testing; computational complexity; VLSI; integrated circuit testing; scanning electron microscopy; electron probe analysis; optical microscopy; circuit analysis computing; digital simulation; gate-level faults; combinational circuits; error sources; fault deduction; fault elimination; ISCAS'85 benchmark circuits; computation time; diagnostic resolution; physical defect analysis; scanning electron microscopy; electron beam probing; light emission microscopy; VLSI (xsd:string)
dc:title A simple technique for locating gate-level faults in combinational circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document