[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/YanagidaTT98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nobuhiro_Yanagida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1998.741619>
foaf:homepage <https://doi.org/10.1109/ATS.1998.741619>
dc:identifier DBLP conf/ats/YanagidaTT98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1998.741619 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nobuhiro_Yanagida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 237- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/YanagidaTT98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/YanagidaTT98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1998.html#YanagidaTT98>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1998.741619>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:title Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document