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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/YokoyamaWT97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Tamamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Yokoyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643982>
foaf:homepage <https://doi.org/10.1109/ATS.1997.643982>
dc:identifier DBLP conf/ats/YokoyamaWT97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1997.643982 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Random Pattern Testable Design with Partial Circuit Duplication. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Tamamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Yokoyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
swrc:pages 353-358 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/YokoyamaWT97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/YokoyamaWT97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1997.html#YokoyamaWT97>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1997.643982>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject Design for testability, Partial circuit duplication, Random testing Built-in self test. (xsd:string)
dc:title Random Pattern Testable Design with Partial Circuit Duplication. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document