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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/YonedaF01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomokazu_Yoneda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.2001.990280>
foaf:homepage <https://doi.org/10.1109/ATS.2001.990280>
dc:identifier DBLP conf/ats/YonedaF01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.2001.990280 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label A DFT Method for Core-Based Systems-on-a-Chip Based on Consecutive Testability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomokazu_Yoneda>
swrc:pages 193-198 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/YonedaF01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/YonedaF01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YonedaF01>
rdfs:seeAlso <https://doi.org/10.1109/ATS.2001.990280>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject consecutive testability, consecutive transparency, test access mechanism, core-based systems-on-a-chip, design for testability (xsd:string)
dc:title A DFT Method for Core-Based Systems-on-a-Chip Based on Consecutive Testability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document