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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ats/YoshidaSMH97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuhiro_Hirayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Reisuke_Shimoda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takaki_Yoshida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Mizokawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FATS.1997.643945>
foaf:homepage <https://doi.org/10.1109/ATS.1997.643945>
dc:identifier DBLP conf/ats/YoshidaSMH97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FATS.1997.643945 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label An effective fault simulation method for core based LSI. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuhiro_Hirayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Reisuke_Shimoda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takaki_Yoshida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Mizokawa>
swrc:pages 116-121 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ats/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ats/YoshidaSMH97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ats/YoshidaSMH97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ats/ats1997.html#YoshidaSMH97>
rdfs:seeAlso <https://doi.org/10.1109/ATS.1997.643945>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ats>
dc:subject random processes; effective fault simulation; core based LSI; handling time; random sampling method; DFS; distributed fault simulation; FPP; faults per pass; hyper faults; mask patterns; yield analysis (xsd:string)
dc:title An effective fault simulation method for core based LSI. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document