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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/bcfic/KarmaniKMKHR12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amir-Mohammad_Rahmani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Belgacem_Hamdi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chiraz_Khedhiri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ka_Lok_Man>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mouna_Karmani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomas_Krilavicius>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBCFIC.2012.6217990>
foaf:homepage <https://doi.org/10.1109/BCFIC.2012.6217990>
dc:identifier DBLP conf/bcfic/KarmaniKMKHR12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBCFIC.2012.6217990 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label A self-test and self-repair approach for analog integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amir-Mohammad_Rahmani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Belgacem_Hamdi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chiraz_Khedhiri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ka_Lok_Man>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mouna_Karmani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomas_Krilavicius>
swrc:pages 117-120 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/bcfic/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/bcfic/KarmaniKMKHR12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/bcfic/KarmaniKMKHR12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/bcfic/bcfic2012.html#KarmaniKMKHR12>
rdfs:seeAlso <https://doi.org/10.1109/BCFIC.2012.6217990>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/bcfic>
dc:title A self-test and self-repair approach for analog integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document