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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/bcicts/IoannouGPR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitris_P._Ioannou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ephrem_G._Gebreselasie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinh_Pham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBCICTS54660.2023.10310696>
foaf:homepage <https://doi.org/10.1109/BCICTS54660.2023.10310696>
dc:identifier DBLP conf/bcicts/IoannouGPR23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBCICTS54660.2023.10310696 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitris_P._Ioannou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ephrem_G._Gebreselasie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinh_Pham>
swrc:pages 245-248 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/bcicts/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/bcicts/IoannouGPR23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/bcicts/IoannouGPR23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/bcicts/bcicts2023.html#IoannouGPR23>
rdfs:seeAlso <https://doi.org/10.1109/BCICTS54660.2023.10310696>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/bcicts>
dc:title Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document