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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajendran_Krishnasamy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rick_Rassel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Ngu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBCICTS45179.2019.8972747>
foaf:homepage <https://doi.org/10.1109/BCICTS45179.2019.8972747>
dc:identifier DBLP conf/bcicts/NguGKR19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBCICTS45179.2019.8972747 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Ballast Resistor Temperature Effect and Ruggedness. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rick_Rassel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Ngu>
swrc:pages 1-4 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/BCICTS45179.2019.8972747>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/bcicts>
dc:title Ballast Resistor Temperature Effect and Ruggedness. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document