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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/bcicts/SepulvedaRamosTLC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Harrison_Lee_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_W._Teng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nelson_Sep%E2%88%9A%C4%BClveda-Ramos>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBCICTS53451.2022.10051752>
foaf:homepage <https://doi.org/10.1109/BCICTS53451.2022.10051752>
dc:identifier DBLP conf/bcicts/SepulvedaRamosTLC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBCICTS53451.2022.10051752 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nelson_Sep%E2%88%9A%C4%BClveda-Ramos>
swrc:pages 62-65 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/BCICTS53451.2022.10051752>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/bcicts>
dc:title Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document