Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/bcicts/WeimerJFS22
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Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.
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Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.
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