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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/bcicts/WierMRYZC18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brian_R._Wier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanbin_Ying>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafael_Perez_Martinez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saeed_Zeinolabedinzadeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBCICTS.2018.8551087>
foaf:homepage <https://doi.org/10.1109/BCICTS.2018.8551087>
dc:identifier DBLP conf/bcicts/WierMRYZC18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBCICTS.2018.8551087 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brian_R._Wier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanbin_Ying>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafael_Perez_Martinez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saeed_Zeinolabedinzadeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan>
swrc:pages 215-218 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/bcicts/2018>
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rdfs:seeAlso <https://doi.org/10.1109/BCICTS.2018.8551087>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/bcicts>
dc:title Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document