Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/bcicts/WierMRYZC18
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/bcicts/WierMRYZC18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Brian_R._Wier
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hanbin_Ying
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rafael_Perez_Martinez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Saeed_Zeinolabedinzadeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FBCICTS.2018.8551087
>
foaf:
homepage
<
https://doi.org/10.1109/BCICTS.2018.8551087
>
dc:
identifier
DBLP conf/bcicts/WierMRYZC18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FBCICTS.2018.8551087
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
rdfs:
label
Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Brian_R._Wier
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hanbin_Ying
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/John_D._Cressler
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rafael_Perez_Martinez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Saeed_Zeinolabedinzadeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Uppili_S._Raghunathan
>
swrc:
pages
215-218
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/bcicts/2018
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/bcicts/WierMRYZC18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/bcicts/WierMRYZC18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/bcicts/bcicts2018.html#WierMRYZC18
>
rdfs:
seeAlso
<
https://doi.org/10.1109/BCICTS.2018.8551087
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/bcicts
>
dc:
title
Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document