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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/biocas/KiyoyamaTGIUSNK16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keita_Ito>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Shimokawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Kiyoyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoru_Nishino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shoma_Uno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Goto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsu_Tanaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshiki_Takezawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FBioCAS.2016.7833792>
foaf:homepage <https://doi.org/10.1109/BioCAS.2016.7833792>
dc:identifier DBLP conf/biocas/KiyoyamaTGIUSNK16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FBioCAS.2016.7833792 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Wide-range and precise tissue impedance analysis circuit with ultralow current source using gate-induced drain-leakage current. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keita_Ito>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Shimokawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Kiyoyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoru_Nishino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shoma_Uno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Goto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsu_Tanaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshiki_Takezawa>
swrc:pages 304-307 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/biocas/biocas2016.html#KiyoyamaTGIUSNK16>
rdfs:seeAlso <https://doi.org/10.1109/BioCAS.2016.7833792>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/biocas>
dc:title Wide-range and precise tissue impedance analysis circuit with ultralow current source using gate-induced drain-leakage current. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document