Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/caine/IslamC02>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Md._Rafiqul_Islam_0001>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Morshed_U._Chowdhury>
dc:identifier	DBLP conf/caine/IslamC02 (xsd:string)
dcterms:issued	2002 (xsd:gYear)
rdfs:label	Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Md._Rafiqul_Islam_0001>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Morshed_U._Chowdhury>
swrc:pages	239-242 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/caine/2002>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/caine/IslamC02/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/caine/IslamC02>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/caine/caine2002.html#IslamC02>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/caine>
dc:title	Eliminating of the Drawback of Existing Testing Technique of Easily Testable PLAs Using an Improved Testing Algorithm with Product Line Rearrangement. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document