[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/caip/AlexanderABBCFLT09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ali_Bouamrani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernhard_G._Bodmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ciro_Chiappini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ennio_Tasciotti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mauro_Ferrari_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Azencott>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Simon_K._Alexander>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/X._Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-03767-2%5F72>
foaf:homepage <https://doi.org/10.1007/978-3-642-03767-2_72>
dc:identifier DBLP conf/caip/AlexanderABBCFLT09 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-03767-2%5F72 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label SEM Image Analysis for Quality Control of Nanoparticles. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ali_Bouamrani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernhard_G._Bodmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ciro_Chiappini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ennio_Tasciotti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mauro_Ferrari_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Azencott>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Simon_K._Alexander>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/X._Liu>
swrc:pages 590-597 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/caip/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/caip/AlexanderABBCFLT09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/caip/AlexanderABBCFLT09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/caip/caip2009.html#AlexanderABBCFLT09>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-03767-2_72>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/caip>
dc:title SEM Image Analysis for Quality Control of Nanoparticles. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document