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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cardis/BigotFGS06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alain_Faivre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9line_Bigot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christophe_Gaston>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Julien_Simon>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F11733447%5F25>
foaf:homepage <https://doi.org/10.1007/11733447_25>
dc:identifier DBLP conf/cardis/BigotFGS06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F11733447%5F25 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Automatic Test Generation on a (U)SIM Smart Card. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alain_Faivre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9line_Bigot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christophe_Gaston>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Julien_Simon>
swrc:pages 345-358 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cardis/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cardis/BigotFGS06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cardis/BigotFGS06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cardis/cardis2006.html#BigotFGS06>
rdfs:seeAlso <https://doi.org/10.1007/11733447_25>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cardis>
dc:title Automatic Test Generation on a (U)SIM Smart Card. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document